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1

On-chip characterization of interconnect parameters and time delay in 0.18 μm CMOS technology for ULSI circuit applications

Hi-Deok Lee, Kim, D.M., Myoung-Jun Jang

Journal:

IEEE Transactions on Electron Devices

Année:

2000

Langue:

english

Fichier:

PDF, 300 KB

english, 2000

2

[IEEE International Electron Devices Meeting 1998. Technical Digest - San Francisco, CA, USA (6-9 Dec. 1998)] International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) - Real time on-chip characterization of time delay arising from multi-level-metallization: decoupling of pure charging and drift-and-charging

Hi-Deok Lee,, Myoung-Jun Jang,, Dae-Gwan Kang,, Young-Jong Lee,, Jeong-Mo Hwang,, Dae-Mann Kim,

Année:

1998

Langue:

english

Fichier:

PDF, 423 KB

english, 1998

3

Characterization of channel width dependence of gate delay in 0.18-μm CMOS technology

Myoung-Kyu Park,, Hi-Deok Lee,, Myoung-Jun Jang,

Journal:

IEEE Electron Device Letters

Année:

1999

Langue:

english

Fichier:

PDF, 68 KB

english, 1999

4

[IEEE ICVC'99. 6th International Conference on VLSI and CAD - Seoul, South Korea (26-27 Oct. 1999)] ICVC '99. 6th International Conference on VLSI and CAD (Cat. No.99EX361) - Optimization of repeater size to minimize interconnect line-induced delay time for high performance VLSI circuits

Myoung-Jun Jang,, Hi-Deok Lee,, Myoung-Kyu Park,, Hae-Wang Lee,, Kyung-Jin Yoo,, Sang-Bok Lee,, Sung-Woong Chung,, Dae-Gwan Kang,, Jeong-Mo Hwang,

Année:

1999

Langue:

english

Fichier:

PDF, 307 KB

english, 1999

5

[IEEE International Electron Devices Meeting 1999. Technical Digest - Washington, DC, USA (5-8 Dec. 1999)] International Electron Devices Meeting 1999. Technical Digest (Cat. No.99CH36318) - Characterization of crosstalk-induced noise for 0.18 μm CMOS technology with 6-level metallization using time domain reflectometry and S-parameters

Hi-Deok Lee,, Myoung-Jun Jang,, Dae-Gwan Kang,, Jeong-Mo Hwang,, Yong-Joo Kim,, Oh-Kyong Kwon,, Dae-Mann Kim,

Année:

1999

Langue:

english

Fichier:

PDF, 360 KB

english, 1999

6

[American Vacuum Soc 2001 6th International Symposium on Plasma- and Process-Induced Damage - Monterey, CA, USA (13-15 May 2001)] 2001 6th International Symposium on Plasma- and Process-Induced Damage (IEEE Cat. No.01TH8538) - Dependence of plasma process induced damage on the transistor gate area

Sung-Hyung Park,, Hi-Deok Lee,, Key-Min Lee,, Myoung-Jun Jang,, Joo-Hyoung Lee,, Geun-Suk Park,, Ki-Seok Yoon,, Jung-Hoon Choi,, Young-Jin Park,, Hee-Goo Youn,

Année:

2001

Langue:

english

Fichier:

PDF, 299 KB

english, 2001

7

Effect of Color of Light Emitting Diode on Development of Fruit Body in Hypsizygus marmoreus

Jang, Myoung-Jun, Lee, Yun-Hae, Ju, Young-Cheol, Kim, Seong-Min, Koo, Han-Mo

Journal:

Année:

2013

Langue:

english

Fichier:

PDF, 3.01 MB

english, 2013

8

Saikosaponin D Isolated from Bupleurum falcatum Inhibits Selectin-Mediated Cell Adhesion

Jang, Myoung-Jun, Kim, Ye, Bae, Eun, Oh, Tae-Seok, Choi, Hwa-Jung, Lee, Jung-Hee, Oh, Hyun-Mee, Lee, Seung

Journal:

Année:

2014

Langue:

english

Fichier:

PDF, 1.90 MB

english, 2014

9

Optimal Conditions for the Mycelial Growth of Coprinus comatus Strains

Jang, Myoung-Jun, Lee, Yun-Hae, Liu, Jun-Jie, Ju, Young-Cheol

Journal:

Année:

2009

Langue:

english

Fichier:

PDF, 2.27 MB

english, 2009

10

Effect of adding amino acids on the production of Gamma-Aminobutyric Acid (GABA) by mycelium of Lentinula edodes

Park, Youn-Jin, Oh, Tae-Seok, Jang, Myoung-Jun

Journal:

International Journal of Food Engineering

Langue:

english

Fichier:

PDF, 903 KB

english

11

Transcriptome analysis of the edible mushroom Lentinula edodes in response to blue light

Kim, Jae Yoon, Kim, Dae Yeon, Park, Youn-Jin, Jang, Myoung-Jun, Nowrousian, Minou

Journal:

Année:

2020

Fichier:

PDF, 4.09 MB

2020

12

Increasing Coverage of Proteome Identification of the Fruiting Body of Agaricus bisporus by Shotgun Proteomics

Ham, Tae-Ho, Lee, Yoonjung, Kwon, Soon-Wook, Jang, Myoung-Jun, Park, Youn-Jin, Lee, Joohyun

Journal:

Année:

2020

Fichier:

PDF, 1.37 MB

2020